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Developed
Surface and Length :
This criteria
is determined by calculating the real area of the surface or the real length
of the profile. It is then expressed in percentage area at the base by :
Ld=100·Lreall
/ NxPx
Sd=100·Sreal
/ (NxPxNyPy)
Calculating
Peaks or Hollows (valleys) - Retention Volume :
A specific
function has been developed to count peaks or valleys. From a given altitude
(Zref), the volumes (Vp, Vv) and the sections which are
associated with them (Sp, Sv) can be calculated for each
peak or valley.

A more global
approach has also been developed to determine the evolution of the retention
volume (Vr) in function of the altitude by ::
This type
of approach is particularly interesting when describing either surfaces involved
in lubrified environments, or contact areas involving more or less rubbery materials
which are in contact with more or less rigid materials
R and
W Criteria (MOTIF) :
The above
criteria "R" and "W" are based on a geometrical empirical
approach, developed by and for the French automobile industry and meant to study
rough profiles.
The standardized
reference number is A32 6100.
This approach
firstly determines the intuitive motifs of roughness. A motif can show a segment
of a profile with two major peaks which serve to calculate the AR steps and
the R amplitude of roughness. An "envelope" profile joining these
peaks is thus obtained. This envelope, in turn, allows to determine the waviness
motifs and thus to calculate the W steps and the waviness amplitudes.

FREQUENTIAL PARAMETERS
By using
the Fast Fourier Transform, directly applied to the discretized signal z(x,y)
or z(x), one can determine the Power Spectral Density PSD (fx,fy),
and the auto-correlation function C(bx,by) from which
the frequential parameters can be studied.
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DSP(fx,fy)= |TF[z(x, y)] | 2
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C(bx , by) = TF[DSP]
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